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Parallel pattern fast fault simulation for three-state circuits and bidirectional I/O

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3 Author(s)
van der Linden, J.T. ; Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands ; Konijnenburg, M.H. ; van de Goor, A.J.

Industrial circuit designs commonly contain three-state elements, such as buses and drivers, transmission gates, and bidirectional I/O. A 5-valued fast fault simulation method and a 4-valued parallel pattern version that can handle these circuits are presented. Results demonstrate the effectiveness of the proposed methods in the presence of three-state elements, and show but a small performance degradation compared to 2- or 3-valued fault simulation

Published in:

Test Conference, 1994. Proceedings., International

Date of Conference:

2-6 Oct1994

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