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Built-in system test and fault location

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1 Author(s)
McLeod, G.R. ; GEC-Marconi Avionics, Edinburgh, UK

In their purest form, BIST, BScan and Scan do not lend themselves to in-service test-compromises and extensions are required. We describe the experience of implementing built-in fault detection and location in a large digital system

Published in:

Test Conference, 1994. Proceedings., International

Date of Conference:

2-6 Oct1994