Cart (Loading....) | Create Account
Close category search window
 

Extended T-S fuzzy model based on interval arithmetic and its application to interval nonlinear regression analysis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Sun Changping ; Key Lab. of Adv. Control for Iron & Steel Process, Univ. of Scinece & Technol. Beijing, Beijing, China ; Xu Zhengguang

In this paper, a new fuzzy system model structure - interval T-S fuzzy model (ITSFM) is proposed. Inspired from interval regression analysis, the interval arithmetic is incorporated with classical T-S fuzzy model and the parameters in consequent part of the ITSFM model become to be interval numbers. Thus, the outputs of the proposed ITSFM are interval numbers. In our ITSFM model, the membership functions are the same as the ones of the classical type. Finally, the proposed ITSFM is applied to interval nonlinear regression analysis with crisp inputs and interval outputs. Experimental results are then presented that indicate the validity and applicability of the proposed ITSFM.

Published in:

Fuzzy Systems, 2009. FUZZ-IEEE 2009. IEEE International Conference on

Date of Conference:

20-24 Aug. 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.