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Conducted susceptibility diagnosis of vehicle electronic module using correlation between mixed-mode S-parameter measurement and bulk current injection test

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6 Author(s)
C. -Y. Ho ; Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung 804, Taiwan ; C. -H. Huang ; T. -S. Horng ; L. -F. Huang
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This paper is devoted to the correlation between the mixed-mode S-parameter measurement and the bulk current injection (BCI) test for studying the conducted susceptibility of vehicle electronic module to the external radio frequency (RF) disturbances. The proposed method uses the common-to-differential mode S-parameter to predict the weakness in immunity for a hex inverter IC on different ground plane structures. The prediction can be further verified by the BCI test results.

Published in:

2009 3rd International Conference on Anti-counterfeiting, Security, and Identification in Communication

Date of Conference:

20-22 Aug. 2009