Cart (Loading....) | Create Account
Close category search window
 

Determination of Hardness and Residual-Stress Variations in Hardened Surface Layers With Magnetic Barkhausen Noise

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Zerovnik, P. ; Fac. of Mech. Eng., Univ. of Ljubljana, Ljubljana, Slovenia ; Grum, J. ; Zerovnik, G.

We use magnetic Barkhausen noise to assess the microstructure, hardness, and residual stresses in hardened surface layers. We performed measurements on induction surface-hardened specimens, the thickness of hardened layers being different in each case. A change in the microstructure of the hardened surface layer produces changes in specific electric conductivity ?? and relative permeability ??r . The two parameters and chosen analyzing frequencies influence the depth sensing of micromagnetic changes. The most commonly chosen characteristic of Barkhausen noise is the V2 RMS value of a captured signal. The choice of frequency determines the depth at which the Barkhausen noise will be analyzed to determine microhardness or residual stresses.

Published in:

Magnetics, IEEE Transactions on  (Volume:46 ,  Issue: 3 )

Date of Publication:

March 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.