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Predictive reliability and prognostics for electronic components: Current capabilities and future challenges

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6 Author(s)
Bailey, C. ; Comput. Mech. & Reliability Group, Univ. of Greenwich, London, UK ; Hua Lu ; Stoyanov, S. ; Chunyan Yin
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Future analysis tools that predict the behavior of electronic components, both during qualification testing and in-service lifetime assessment, will be very important in predicting product reliability and identifying when to undertake maintenance. This paper will discuss some of these techniques and illustrate these with examples. The paper will also discuss future challenges for these techniques.

Published in:

Electronics Technology, 2008. ISSE '08. 31st International Spring Seminar on

Date of Conference:

7-11 May 2008

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