Cart (Loading....) | Create Account
Close category search window

Iterative learning control for processes with uncertain time delay using minimum entropy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Junghui Chen ; Dept. of Chem. Eng., Chung-Yuan Christian Univ., Chungli, Taiwan ; Chu Chih-Chiang ; Munoz, J. ; Jianhua Zhang

In most batch processes, quality control measurements cannot be completed before the next batch operation. Thus, the corrective step is often delayed by one batch or more. The uncertain duration of delay with stochastic characteristics can be treated as a random variable of unknown distribution. Coupled with inaccurate process models, the delay may lead to significant process output variations even with EWMA controllers. This paper proposes a new method of handling the uncertain metrology delay and its ensuing complications. The run-to-run controller is designed based on minimization of error entropy, and the probability density function of the tracking error can be estimated by the historical operation data. The simulation example demonstrates the effectiveness of the proposed method.

Published in:

Asian Control Conference, 2009. ASCC 2009. 7th

Date of Conference:

27-29 Aug. 2009

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.