Scheduled System Maintenance:
On May 6th, system maintenance will take place from 8:00 AM - 12:00 PM ET (12:00 - 16:00 UTC). During this time, there may be intermittent impact on performance. We apologize for the inconvenience.
By Topic

FOGBUSTER: an efficient algorithm for sequential test generation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
2 Author(s)
Glaser, U. ; German Nat. Res. Center for Comput. Sci., St. Augustin, Germany ; Vierhaus, H.T.

Automatic test pattern generation yielding high fault coverage for CMOS circuits has received a wide attention in industry and academia for a long time. Scan techniques were used to break down the sequential ATPG problem to combinational test generation. As the overhead necessary for scan design can not be spent for all circuits, sequential test generation techniques gained importance. In this paper the FOGBUSTER (FOrward propaGation Backward jUstification Sequential Test genERation) algorithm is described and experimental results for the ISCAS '89 benchmark circuits are shown. FOGBUSTER is a complete algorithm which makes use of a forward propagation technique which is more efficient in general than the backward propagation technique used in the well known BACK-algorithm

Published in:

Design Automation Conference, 1995, with EURO-VHDL, Proceedings EURO-DAC '95., European

Date of Conference:

18-22 Sep 1995