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Voltage suppression devices are needed in electronic systems to prevent damage to electrical components from electrical overstress (EOS) and electrostatic discharge (ESD) events. A low capacitance, polymer voltage-suppressor (PVS) device is evaluated using various testing techniques that combine transmission line pulse (TLP) test system, direct discharge HBM, and a system-level ESD gun. Additionally, test methods for integrating PVS devices for system-level ESD protection of cell phone GaAs radio frequency (RF) switches and Gigabit Ethernet server semiconductors will be shown. Our work demonstrates the need for integration of device-level and system-level test methodologies for correlation between component ESD survivability and system-level ESD concerns.