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Voltages before and after HBM stress and their effect on dynamically triggered power supply clamps

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4 Author(s)
Ashton, R.A. ; White Mountain Labs., Phoenix, AZ, USA ; Weir, B.E. ; Weiss, G. ; Meuse, T.

HBM and TLP measurements on dynamically triggered CMOS power supply clamps were found to be inconsistent for low leakage clamps. The failures at low HBM voltage were found to be due to a voltage ramp leading up to the HBM pulse which prevented the clamps from turning on.

Published in:

Electrical Overstress/Electrostatic Discharge Symposium, 2004. EOS/ESD '04.

Date of Conference:

19-23 Sept. 2004