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An investigation of integrated circuit destruction by noise pulses

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1 Author(s)
Appleby, T.H. ; , Saint Germain-en-Laye, France

Conventional integrated circuits have a high failure rate when operated in an environment including electromechanical switching systems. This paper discusses the destruction modes for the circuits and the equivalent circuit for the noise generation system. Experimental results which support the concept of the equivalent circuit are discussed. Finally, the transient thermal characteristics of typical packaging systems are briefly discussed.

Published in:

Radio and Electronic Engineer  (Volume:43 ,  Issue: 4 )