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On-chip decoupling capacitor design to reduce switching-noise-induced instability in CMOS/SOI VLSI

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2 Author(s)
Wang, L.K. ; IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA ; Chen, H.H.

The supply noise from the packaging of CMOS/SOI circuits can cause performance degradation, reliability reduction and even loss of circuit functionality due to the device latch-up problem. By properly adding on-chip decoupling capacitors in the proximity of the circuitry, we can effectively alleviate the switching noise problem and improve the performance of CMOS/SOI circuits

Published in:

SOI Conference, 1995. Proceedings., 1995 IEEE International

Date of Conference:

3-5 Oct 1995