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The temperature dependence of the ferromagnetic-resonance field (Hres) and line width (DeltaH) of epitaxial Fe thin films were studied. It is observed that Hres increases whereas DeltaH decreases with the increase in temperature. The change in Hres is governed by the temperature dependence of the saturation magnetization and the magneto-crystalline anisotropy energy of the film. The present low-temperature investigations of Hres obeys the well-known T3/2 Bloch law. The resonance line width as a function of temperature shows a transition temperature (T1) separating two different regimes. This behavior may be associated with the temperature dependence of the anistropy. The Hres results are confirmed theoretically by simulating the power absorbed at ferromagnetic resonance by using the Landau-Lifsthiz-Gilbert equation.