By Topic

Multiferroic Properties of BiFeO _{3} Ceramic and Thin Film and BiFeO _{3} /Co/BiFeO _{3} Multilayer Structure

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Wang, Z.-H. ; Grad. Inst. of Appl. Sci. & Eng., Fu Jen Catholic Univ., Taipei, Taiwan ; Ding, Y. ; Tu, C.S. ; Lin, T.-C.
more authors

In situ X-ray diffraction of BiFeO3 (BFO) ceramic and thin film has been carried out as a function of temperature (25degC-900degC) upon heating. The BFO thin film was deposited on Pt/TiOx/SiOx/Si(100) substrate by radio-frequency magnetron sputtering at 650degC. BFO thin film exhibits a structural transformation from rhombohedral to cubic in the region of 700-750degC upon heating. The magnetic property of BiFeO3/Co/BiFeO3 multilayer structure changes from diamagnetic to ferromagnetic phases with increasing thickness of Co layer. The dielectric permittivities (real and imaginary parts) of BiFeO3 ceramic exhibit a frequency-dependent relaxation-like behavior and its magnitude (real part) is higher than 1000 for f les 1 MHz. Surface morphology shows that the root-mean-square roughness of BFO thin film varies with sputtering power.

Published in:

Magnetics, IEEE Transactions on  (Volume:45 ,  Issue: 10 )