Cart (Loading....) | Create Account
Close category search window
 

Developments in techniques for simulating faults in e.h.v. transmission systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Johns, A.T. ; University of Bath, Power Systems Laboratory, School of Electrical Engineering, Bath, UK ; El-Kateb, M.M.T.

In the study of the faulted response of power systems, synchronous sources are often represented by subtransient impedances. Alternatively, more elegant synchronous-source models are often combined with simplified models of transmission-line interconnections. In the paper, methods are developed which enable more accurate models of synchronous sources to be combined with generator/transformer and distributed-parameter frequency-variant transmission-line interconnections. The methods are developed by reference to a single generator connected to an assumed-infinite busbar via a delta-star transformer and a transmission line, the techniques relating to digitally simulating the synchronous source having been established in an earlier paper. The paper concludes with a presentation of some computational results relating to faults at the remote end of a 400 kV interconnection of length 160 km.

Published in:

Electrical Engineers, Proceedings of the Institution of  (Volume:125 ,  Issue: 3 )

Date of Publication:

March 1978

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.