Cart (Loading....) | Create Account
Close category search window
 

Effects of nonlinearities on the measurement of weighting functions by crosscorrelation using pseudorandom signals

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Barker, H.A. ; University of Aston, Department of Electrical Engineering, Birmingham, UK ; Obidegwu, S.N.

In this paper, expressions are obtained for the errors introduced into the estimate of a system weighting function obtained by crosscorrelation when nonlinearities that may be described by a Volterra functional series are present. Explicit results are given for systems with second-and third-order nonlinearities, tested by pseudorandom signals derived from binary and ternary m sequences. It is shown that the principal errors are of two distinct types: a systematic error that is the same for all pseudorandom signals of a common type, and an unsystematic error that depends on relationships between members of the m sequence from which the pseudorandom signal is derived. The unsystematic error may be removed from a range of interest extending over the settling time of the system by an appropriate choice of test signal, and those pseudorandom signals most suitable for this purpose are identified. An example is used both to illustrate and to validate the results obtained.

Published in:

Electrical Engineers, Proceedings of the Institution of  (Volume:120 ,  Issue: 10 )

Date of Publication:

October 1973

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.