Close category search window
 

Return-difference and return-ratio matrices and their use in analysis and design of multivariable feedback control systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
MacFarlane, A.G.J. ; University of Manchester Institute of Science & Technology, Department of Electrical Engineering, Manchester, UK

Bode's concepts of return difference and return ratio are shown to play a fundamental role in the analysis of multivariable feedback control systems. Matrix transfer functions are regarded as operators on linear vector spaces over the field of rational functions in the complex variable s. The eigenvalues of such operators are identified as characteristic transfer functions. The corresponding characteristic frequency responses provide a simple and natural link between classical single-loop design techniques and multivariable-system feedback theory. These concepts then serve as a unifying thread in a coherent and systematic discussion of multivariable-feedback-system design techniques.

Published in:
Electrical Engineers, Proceedings of the Institution of  (Volume:117 ,  Issue: 10 )

Date of Publication: October 1970

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.