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Browse Journals & Magazines > Journal of Applied Physics ...> Volume:106 Issue:5 Help

Structural properties of buried conducting layers formed by very low energy ion implantation of gold into polymer

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4 Author(s)
Teixeira, F.S. ; Polytechnic School, University of São Paulo, Avenida Professor Luciano Gualberto, Travessa R-158, CEP 05508-900 São Paulo, SP, Brazil ; Salvadori, M.C. ; Cattani, M. ; Brown, I.G.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3212574 

We have investigated the fundamental structural properties of conducting thin films formed by implanting gold ions into polymethylmethacrylate (PMMA) polymer at 49 eV using a repetitively pulsed cathodic arc plasma gun. Transmission electron microscopy images of these composites show that the implanted ions form gold clusters of diameter ∼2–12 nm distributed throughout a shallow, buried layer of average thickness 7 nm, and small angle x-ray scattering (SAXS) reveals the structural properties of the PMMA-gold buried layer. The SAXS data have been interpreted using a theoretical model that accounts for peculiarities of disordered systems.

Published in:
Journal of Applied Physics  (Volume:106 ,  Issue: 5 )

Date of Publication: Sep 2009

Page(s):
056106 - 056106-3
ISSN :
0021-8979
Digital Object Identifier :
10.1063/1.3212574
Product Type:
Journals & Magazines
Date of Current Version :
18 September 2009
Issue Date :
Sep 2009

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