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CMOS circuits for on-chip capacitance ratio testing or sensor readout

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2 Author(s)
Yuming Cao ; Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA ; G. C. Temes

Novel CMOS circuits are described for the on-chip measurement of capacitor ratios. They can provide a high-accuracy A/D interface for capacitive sensors, or allow the precise calibration of switched-capacitor DACs, amplifiers and other circuits utilizing ratioed capacitors

Published in:

Circuits and Systems, 1995. ISCAS '95., 1995 IEEE International Symposium on  (Volume:3 )

Date of Conference:

30 Apr-3 May 1995