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Yield gain with memory BISR — a case study

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2 Author(s)
Maddumage Karunaratne ; University of Pittsburgh, USA ; Bejoy Oomann

We applied a BIST soft repair scheme to embedded memories using redundant data columns. We obtained yield and defect data from commercial silicon parts, and explored possible yield improvements with only a single bit repair. We implemented it on a chip with 90 memories and process margins were changed to obtain split lots to validate the repair scheme.

Published in:

2009 52nd IEEE International Midwest Symposium on Circuits and Systems

Date of Conference:

2-5 Aug. 2009