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Impulse signal generation and measurement technique for cost-effective Built-In Self Test in analog mixed-signal systems

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2 Author(s)
Wimol San-Um ; Kochi Univ. of Technol., Kami, Japan ; Masayoshi, T.

This paper presents an impulse signal generation and measurement technique for cost-effective built-in self test (BIST) in analog mixed-signal systems. The testing technique is based on a single effective sampling point of impulse responses. This technique offers high fault coverage and a high speed testing process, and eliminates the need for high-precision analog stimuli and complicated fault characterization algorithms. The BIST is relatively compact, implemented by a delay line and a track-and-hold circuit with window comparator. No fault-free bit streams and digital processing units are required. Trails of the BIST system for the 8th-order Sallen-Key lowpass filter using 0.18-mum CMOS technology show a low area overhead of 11.19%. High fault coverage of 98.24% for both catastrophic faults and parameter variations was achieved.

Published in:

Circuits and Systems, 2009. MWSCAS '09. 52nd IEEE International Midwest Symposium on

Date of Conference:

2-5 Aug. 2009