Cart (Loading....) | Create Account
Close category search window

Analysis of Measurement Method for Critical Current Density by Using Permanent Magnet

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Ikuno, S. ; Sch. of Comput. Sci., Tokyo Univ. of Technol., Hachioji, Japan ; Takayama, T. ; Kamitani, A. ; Takeishi, K.
more authors

The permanent-magnet method for measuring critical current density in high-temperature superconducting thin films is numerically and experimentally investigated. Numerical results show that the critical current density is approximately proportional to the maximum repulsive force. Furthermore, the maximum repulsive force increases as the value of diameter of permanent magnet increases. This tendency is also observed in the experimental investigation. Finally, spatial distributions of the shielding current density are experimentally reproduced by the system.

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:19 ,  Issue: 5 )

Date of Publication:

Oct. 2009

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.