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A detailed atomic force microscopy (AFM) study of the conductance of hydrogenated single-crystal diamond (100) surfaces over submicron length scales is presented. The hydrogenation process was found to influence the surface morphology by reducing surface roughness, with the subsequent appearance of small triangular structures (with side lengths of 200 nm). Conducting AFM measurements revealed variations in the current and resistance that were related to the topography. Possible explanations include surface inhomogeneity of the electronic structure or variations in the contact resistance due to the surface roughness.