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Failure analysis of odd/even word-line failure to improve the endurance performance of a NAND Flash

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5 Author(s)
Young Sun ; Semicond. Manuf. Int. Corp., Shanghai, China ; Zhang, M. ; Jossen Yu ; Dong, W.
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A full-flow failure analysis (FA) was introduced in this paper. From the FA, we resolved odd/ even word-line failure which lead to poor endurance performance of a NAND Flash. After removing this defect, the endurance performance of this NAND Flash is greatly enhanced.

Published in:

Physical and Failure Analysis of Integrated Circuits, 2009. IPFA 2009. 16th IEEE International Symposium on the

Date of Conference:

6-10 July 2009