By Topic

RF power loss, local electric and magnetic field enhancement due to surface roughness

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Peng Zhang ; Dept. of Nucl. Eng. & Radiol. Sci., Univ. of Michigan, Ann Arbor, MI, USA ; Lau, Y.Y. ; Gilgenbach, R.M.

Surface roughness plays an important role in a cavity or slow wave structure. It may cause enhanced RF power absorption. It may lead to excessive local electric field enhancement that triggers RF breakdown. In a superconducting cavity, surface roughness may also cause local magnetic field enhancement that leads to abrupt quenching, i.e., rapid loss of superconductivity. In this work, we analytically compute the power absorption due to a hemispherical protrusion on a resonant cavity's surface. The local field enhancement factors of both electric field and magnetic field on the protrusion are also calculated analytically. This protrusion may represent a foreign object since its permittivity ??, permeability ?? and conductivity ?? may take on arbitrary values. Scaling laws are derived.

Published in:

Plasma Science - Abstracts, 2009. ICOPS 2009. IEEE International Conference on

Date of Conference:

1-5 June 2009