Cart (Loading....) | Create Account
Close category search window
 

Semisupervised Multicategory Classification With Imperfect Model

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Hong Chen ; Fac. of Math. & Comput. Sci., Hubei Univ., Wuhan, China ; Luoqing Li

Semisupervised learning has been of growing interest over the past years and many methods have been proposed. While existing semisupervised methods have shown some promising empirical performances, their development has been based largely on heuristics. In this paper, we investigate semisupervised multicategory classification with an imperfect mixture density model. In the proposed model, the training data come from a probability distribution, which can be modeled imperfectly by an identifiable mixture distribution. Furthermore, we propose a semisupervised multicategory classification method and establish its generalization error bounds. The theoretical analysis illustrates that the proposed method can utilize unlabeled data effectively and can achieve fast convergence rate.

Published in:

Neural Networks, IEEE Transactions on  (Volume:20 ,  Issue: 10 )

Date of Publication:

Oct. 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.