Cart (Loading....) | Create Account
Close category search window

Texture Retrieval by Scale and Rotation Invariant Directional Empirical Mode Decomposition

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Mingliang Hou ; Huaihai Inst. of Technol., Lianyungang, China ; Cunhua Li ; Yong Zhang

In this paper, a method for texture retrieval based on scale and rotation invariant directional empirical mode decomposition (SRIDEMD) is presented. Different from other filtering based techniques such as wavelet and Gabor decomposition, EMD uses the nonlinear filtering process called 'sifting' which attains its scalead aptivity and obtained intrinsic mode functions (IMFs) which has approximate orthogonality. We extend DEMD which is a fast technique of extending 1D EMD to 2D case by introducing scale and rotation invariance. Features including frequency and envelopes of IMFs are extracted after 2D Hilbert transform. Decomposition in several directions is made for rotation invariance and main direction is used. Scale-invariant features are attained by further processing the results and using fractal dimensions of the residues and IMFs. We validate the effectiveness of this method by experiments for textures from public texture database.

Published in:

Computer and Information Science, 2009. ICIS 2009. Eighth IEEE/ACIS International Conference on

Date of Conference:

1-3 June 2009

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.