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Browse Journals & Magazines > Reliability, IEEE Transaction ...> Volume:R-34 Issue:5 Help

IRAS, An Interactive Reliability Analysis System for Electronic Circuits

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2 Author(s)
Brombacher, A.C. ; BS; Department of Electronics; Twente University of Technology; Postbox 217; 7500 AE Enschede; The NETHERLANDS. ; Peeters, Ir.W.F.J.

IRAS is a general purpose reliability analysis program for evaluating the reliability of electronic circuits in various ways, viz, part count, part count using DC stress, extended FMECA. It uses MIL-HDBK-217D procedures. IRAS runs on an IBM PC/XT computer.

Published in:
Reliability, IEEE Transactions on  (Volume:R-34 ,  Issue: 5 )

Date of Publication: Dec. 1985

Page(s):
507 - 509
ISSN :
0018-9529
Digital Object Identifier :
10.1109/TR.1985.5222247
Product Type:
Journals & Magazines
Date of Current Version :
25 August 2009
Issue Date :
Dec. 1985
Sponsored by :
IEEE Reliability Society

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