Cart (Loading....) | Create Account
Close category search window
 

ESCAFߝA New and Cheap System for Complex Reliability Analysis and Computation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Laviron, A. ; French Atomic Energy Commission (CEA), Commissariat à l''Energie Atomique; Section d''Etudes Expérimentales de Sûreté Nucléaire et de Criticité; Valduc; B.P. 21; 21120 Is-Sur-Tille, FRANCE. ; Carnino, A. ; Manaranche, J.C.

ESCAF stands for ``Ensemble de Simulation et de Calcul de Fiabilité'' - (``Electronic Simulator to Compute and Analyze Failures''). This paper describes the apparatus and illustrates, with examples, the multiple possibilities afforded to system design engineers, reliability engineers, and researchers: 1. Simulating and analyzing, directly or through fault trees, complex systems with as many as 416 components. 2. Simulating and analyzing networks with 2-way information flow. 3. Studying sequential circuits and flow networks. An exceptionally simple, cheap, and easy-to-use apparatus, ESCAF is employed typically to determine and list cut sets and (for s-coherent systems) minimal cut sets, or path sets and minimal path sets; to gauge the importance of each component or event by constructing histograms; to compute system failure probability or unavailability, for both s-coherent and non-coherent systems; and to detect potential weak-points in design. An optional diode plug programming matrix allows common-cause failures to be studied. To analyze a system with ESCAF, it is simulated very simply by standard integrated circuits mounted on one or more special cards. When inserted in the 440 × 226 × 470 mm basic ESCAF unit, these cards are automatically connected to a failure combination generator. This circuit generates all combinations of component failures (or fault tree basic events), first one-by-one, then two-by-two, and so on. The ESCAF processing unit analyzes the resulting system output states and derives the wanted information. The basic ESCAF unit is connected to one or two standard peripherals (visual display unit, printer, punched tape or diskette, etc.

Published in:

Reliability, IEEE Transactions on  (Volume:R-31 ,  Issue: 4 )

Date of Publication:

Oct. 1982

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.