By Topic

Confidence Intervals and Tests of Hypotheses for the Reliability of a 2-Parameter Weibull System

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Albert H. Moore ; Air Force Institute of Technology (AFIT/ENC); Wright-Patterson AFB OH 45433 USA. ; H. Leon Harter ; David F. Antoon

A Monte Carlo simulation (2000 repetitions) is conducted to find empirically the standard deviation of the reliability of a system whose underlying distribution is a 2-parameter Weibull, for various values of the true reliability and the sample size n. The empirical values of the standard deviation are compared with values computed from an asymptotic formula based on the Cramér-Rao lower bound for the variance of an unbiased estimator. A general test of hypotheses developed in this paper is used for two hypothesized values of reliability, and uses the asymptotic standard deviations corresponding to the two values of reliability. Lower s-confidence limits for the true reliability are also calculated, again using the asymptotic standard deviation. These lower s-confidence limits agree closely with the results of a Monte Carlo simulation.

Published in:

IEEE Transactions on Reliability  (Volume:R-30 ,  Issue: 5 )