Cart (Loading....) | Create Account
Close category search window
 

An improved approach of cross-range scaling in ISAR

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Zhishun She ; Dept. of Electron. Eng., Nanjing Univ. of Aeronaut. & Astronaut., China ; Zhaoda Zhu

We have developed an approach of ISAR cross-range scaling. The fundamental principle is that we can estimate the rotating angle of target relative to radar-line-of-sight (RLOS) during the total coherent processing interval via the tomographic formation. However, the multi-dimensional search involved in the estimation of rotating angle will result in huge computational load. In this paper, an improved approach of cross-range scaling in ISAR is presented which takes the place of tomographic formation with the extended coherent processing and modifies the criterion to search the rotating angle. The processing results of computer simulated data and real data of model B-52 collected in a microwave anechoic chamber show that the improved approach is able to carry out the cross-range scaling of ISAR accurately. As compared with the previous method, its computational complexity is greatly reduced

Published in:

Aerospace and Electronics Conference, 1995. NAECON 1995., Proceedings of the IEEE 1995 National  (Volume:2 )

Date of Conference:

22-26 May 1995

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.