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Browse Journals & Magazines > Reliability, IEEE Transaction ...> Volume:R-27 Issue:5 Help

Optimal Allocation of Fault Detectors

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4 Author(s)
Takami, I. ; Takasago Technical Institute; Mitsubishi Heavy Industries, Ltd.; 2-1-1 Shinhama, Araicho; Takasago 676 JAPAN. ; Inagaki, T. ; Sakino, E. ; Inoue, K.

A Markov model is given for a class of series systems which have fault detectors to find component failures. The optimal allocation of fault detectors is determined. This problem is a nonlinear 0-1 integer programming (0-1 IP) problem. The problem is solved easily because the nonlinearity is of a special type. An illustrative example is given.

Published in:
Reliability, IEEE Transactions on  (Volume:R-27 ,  Issue: 5 )

Date of Publication: Dec. 1978

Page(s):
360 - 362
ISSN :
0018-9529
Digital Object Identifier :
10.1109/TR.1978.5220421
Product Type:
Journals & Magazines
Date of Current Version :
25 August 2009
Issue Date :
Dec. 1978
Sponsored by :
IEEE Reliability Society

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