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Cost-Optimized Burn-In Duration for Repairable Electronic Systems

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2 Author(s)
Plesser, Kenneth T. ; The Johns Hopkins University; Applied Physics Laboratory; Laurel MD 20810 USA. ; Field, Thomas O.

A mathematical model permits determining the duration of cost-optimized burn-in and evaluating the resultant saving for repairable electronics systems. Infant mortality failures occur according to a nonhomogeneous Poisson Process; repair actions restore the system to a bad-as-old condition. The s-expected costs associated with factory and field failures are traded-off with the costs of implementing a burn-in program. Under the constraints of the model, the optimum burn-in duration and consequent cost saving are independent of the eventual life of the system in the field. A numerical example illustrates these concepts.

Published in:

Reliability, IEEE Transactions on  (Volume:R-26 ,  Issue: 3 )