By Topic

Cost Model for Testing Program Based on Nonhomogeneous Poisson Failure Model

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
John Donelson ; Institute for Defense Analyses; Program Analysis Division; 400 Army-Navy Drive; Arlington, VA 22202 USA

A model for the s-expected cost of a development testing program is presented in this paper. The total cost function consists of two terms. The first term is proportional to the duration of the testing program; the second term is a loss function that assesses additional costs for failure to meet reliability goals during the testing program. The reliability growth model assumes that failures during the program occur according to a nonhomogeneous Poisson process having a power-law rate. An example shows how the duration of the test program can be chosen to minimize s-expected total cost.

Published in:

IEEE Transactions on Reliability  (Volume:R-26 ,  Issue: 3 )