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An Application of a Markovian Model to the Prediction of the Reliability of Electronic Circuits

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1 Author(s)
Tainiter, M. ; Johns Hopkins University, Baltimore, Md.

In this paper we describe how a model based on the theory of continuous-time Markov processes can be used to compute the reliability of electronic circuits, from data on the drift and failure of the individual components of the circuit. Specific examples of the method are given to show that useful results are obtained.

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Reliability, IEEE Transactions on  (Volume:R-12 ,  Issue: 4 )