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A Monte Carlo Technique for Obtaining System Reliability Confidence Limits from Component Test Data

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2 Author(s)
Louis L. Levy ; Major USAF, Electronic Systems Divison, L. G. Hanscom Field, Bedford, Mass. ; Albert H. Moore

A digital computer technique is developed, using a Monte Carlo simulation based on common probability models, with which component test data may be translated into approximate system reliability limits at any confidence level. The probability distributions from which the component failures are assumed to come are the exponential, Weibull (shape parameter K known), gamma (shape parameter ¿ known), normal, and lognormal. The components can be arranged in any system configuration, series, parallel, or both. Since reliability prediction is meaningful only when expressed with an associated confidence leve, this method provides a valuable and economical tool for the reliability analyst.

Published in:

IEEE Transactions on Reliability  (Volume:R-16 ,  Issue: 2 )