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A Comparison of Methods for Analyzing Censored Life Data to Estimate Relationships Between Stress and Product Life

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2 Author(s)
Gerald J. Hahn ; Corporate Research and Development Center, General Electric Company, Schenectady, N. Y. 12345. ; Wayne Nelson

This article briefly reviews graphical, maximum likelihood, and linear estimation methods for analyzing censored life data to estimate relationships between stress and product life. Each method is illustrated by an example dealing with accelerated life test data on motor insulation. The advantages and disadvantages of the methods are compared to guide the choice of a method for a given application.

Published in:

IEEE Transactions on Reliability  (Volume:R-23 ,  Issue: 1 )