Cart (Loading....) | Create Account
Close category search window

Reliability Optimization by 0-1 Programming for a System with Several Failure Modes

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Hyun, Kwang-Nam ; Dept. of Management Engineering//Ashikaga Institute of Technology//Ashikaga-shi, Tochigi-ken 326 JAPAN

Mathematical models for reliability of a redundant system with two classes of failure modes are usually formulated as a nonlinear integer programming (NIP) problem. This paper reformulates the NIP problem into a 0-1 linear programming (ZOLP) problem and a one-to-one correspondence is shown between this NIP problem and the ZOLP problem. A NIP example treated by Tillman is formulated into a ZOLP problem and optimal solutions, identical to Tillman's are obtained by an implicit enumeration method. Calculating the new coefficients of the objective function and the constraints in the ZOLP are straight forward. There are not many constraints or variables in the proposed ZOLP. Consequently, the computation (CPU) time is less.

Published in:

Reliability, IEEE Transactions on  (Volume:R-24 ,  Issue: 3 )

Date of Publication:

Aug. 1975

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.