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An interconnected model is developed, whereby system reliability is studied from both the standpoint of the probability of failure and also the expected value of unserved load. Explicit algorithms (for use on a digital computer) are presented for the calculation of both of these values. Unlike a previous model, this one involves summing over the failure states, thereby allowing the study of each of these aspects of reliability; it also takes into account tie-line limitations. Interconnections could produce a more reliable pair of systems than an expansion would.