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A New Design Tool: The Matched Characteristic Method of Nonlinear Analysis

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1 Author(s)
Mark, Donald G. ; Advanced Electronics Group, Battelle Memorial Institute, Columbus, Ohio

The analytical method presented here simplifies problems associated with transmitting transistor and diode characteristics from the semiconductor manufacturer to the electronic designer. This novel approach permits the base and collector characteristics of any individual transistor of a given type to be derived from the nominal characteristics of that type by use of a set of matching factors and terms that modify the nominal characteristics to suit that individual. Availability of complete characteristics allows the designer to accurately simulate the nonlinear behavior of the device in a circuit by means of a convergent iterative process.

Published in:

Reliability, IEEE Transactions on  (Volume:R-14 ,  Issue: 1 )

Date of Publication:

March 1965

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