Referenced Items are not available for this document.
Defect classification in the liquid crystal display (LCD) manufacturing process is one of the most crucial issues for quality control. To resolve this constraint, an automatic defect classification (ADC) method based on machine learning is proposed. Key features of LCD micro-defects are defined and extracted, and support vector machine is used for classification. The classification performance is presented through several experimental results.
Published in:
Industrial Electronics, 2009. ISIE 2009. IEEE International Symposium on
Date of Conference: 5-8 July 2009
- Page(s):
- 2175 - 2177
- E-ISBN :
- 978-1-4244-4349-9
- Print ISBN:
- 978-1-4244-4347-5
- INSPEC Accession Number:
- 10846840
- Conference Location :
- Seoul
- Digital Object Identifier :
- 10.1109/ISIE.2009.5213760
- Product Type:
- Conference Publications
About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.
