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Automatic defect classification of TFT-LCD panels using machine learning

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4 Author(s)
Kang, S.B. ; R&D Center, SNU Precision, Co., Ltd., Seoul, South Korea ; Lee, J.H. ; Song, K.Y. ; Pahk, H.J.

Defect classification in the liquid crystal display (LCD) manufacturing process is one of the most crucial issues for quality control. To resolve this constraint, an automatic defect classification (ADC) method based on machine learning is proposed. Key features of LCD micro-defects are defined and extracted, and support vector machine is used for classification. The classification performance is presented through several experimental results.

Published in:

Industrial Electronics, 2009. ISIE 2009. IEEE International Symposium on

Date of Conference:

5-8 July 2009

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