Orientated NaNbO3 (NN) films were grown on SrRuO3/(001)SrTiO3 [SRO/(001)STO], SRO/(110)STO, and SRO/(111)STO substrates by pulsed laser deposition. Scanning electron microscopy images showed that the surface morphologies of the NN/SRO/(001)STO, NN/SRO/(110)STO, and NN/SRO/(111)STO took the form of a stepped structure, a striped pattern, and trigonal pyramidal-like structures, respectively. The dielectric and ferroelectric properties of the films were characterized. The NN/SRO/(110)STO film showed the lowest relative dielectric constant and the largest remanent polarization of 30.8 μC/cm2 among all films. These were interpreted as being due to the orientation direction of the NN film grown on (110)STO being parallel to the polarization direction of NN.
Published in:
Applied Physics Letters
(Volume:95
,
Issue:
6
)
Date of Publication:
Aug 2009
- Page(s):
-
062906
-
062906-3
- ISSN :
-
0003-6951
- Digital Object Identifier :
-
10.1063/1.3205103
- Product Type:
-
Journals & Magazines
- Date of Current Version :
-
21 August 2009
- Issue Date :
-
Aug 2009