Cart (Loading....) | Create Account
Close category search window
 

Elimination of Accumulated Error of 3D Target Location Based on Dual-View Reconstruction

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)

3D target location from long image sequence with a single hand-held camera based on dual-view reconstruction is an important method in practice, but accumulated error is unvoidable and can not be ignored in the process of several dual-view reconstruction especially the length of sequences is long. The paper studied the principle of dual-view reconstruction of long image sequences and the cause of accumulated error. An improved method of 3D target location using truncated sequences to eliminate accumulated error is put forward. An four-element method of rigid body transformation is also presented in this method to solve absolute orientation. Simulated experiments as well as real image tests show that the new method gives an accurate and robust result even in the high-level noise situation. It can be applied to measuring large object, key points registration interference checking in some assembly scenarios and CAD model, etc.

Published in:

Electronic Commerce and Security, 2009. ISECS '09. Second International Symposium on  (Volume:2 )

Date of Conference:

22-24 May 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.