Cart (Loading....) | Create Account
Close category search window

Feature Selection for Cancer Classification Based on Support Vector Machine

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Wei Luo ; Coll. of Inf. Eng., Xiangtan Univ., Xiangtan, China ; Lipo Wang ; Jingjing Sun

Feature selection plays an important role in cancer classification, for gene expression data usually have a large number of dimensions and relatively a small number of samples. In this paper, we use the support vector machine (SVM) for cancer classification. We propose a mixed two-step feature selection method. The first step uses a modified t-test method to select discriminatory features. The second step extracts principal components from the top-ranked genes based on the modified t-test method. We tested our two-step method in three data sets, i.e., the lymphoma data set, the SRBCT data set, and the ovarian cancer data set. The results in all the three data sets show our two-step methods is able to achieve 100% accuracy with much fewer genes than other published results.

Published in:

Intelligent Systems, 2009. GCIS '09. WRI Global Congress on  (Volume:4 )

Date of Conference:

19-21 May 2009

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.