By Topic

ADC based measurements: Identification of the parameters for the uncertainty evaluation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Spataro, C. ; Dept. of Electr., Electron. & Telecommun. Eng., Univ. of Palermo, Palermo, Italy

In the last years, many Authors have dealt with the uncertainty evaluation of the measurement performed by using an analog-to-digital converter, proposing different approach to analyze the uncertainty propagation. In all these studies, it is clearly pointed out that starting from the manufacturer specifications is the least expensive, the least time consuming and, often, the most accurate way to assess the uncertainties. However, the Authors, which have proposed methodologies for the uncertainty assessment, use different parameters as starting point. One of the main reasons which has caused this situation is the coexistent of various Standards concerning the characterization of the analog-to-digital converters. Target of the paper is the choice, among the large number of parameters proposed by the various Standards, of a minimum set of figures of merit which allows a correct uncertainty evaluation of a generic measurement performed by using an analog-to-digital converter.

Published in:

Advanced Methods for Uncertainty Estimation in Measurement, 2009. AMUEM 2009. IEEE International Workshop on

Date of Conference:

6-7 July 2009