Referenced Items are not available for this document.
Heavy ion SEE studies on three 4-Gbit NAND-flash memory types were performed at the RADEF facility at the University of Jyvaskyla, Finland with particular emphasis on SEFI differentiation. An error classification for complex memory devices is introduced, and respective cross sections are reported.
Published in:
Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
Date of Conference: 10-14 Sept. 2007
- Page(s):
- 1 - 4
- ISSN :
- 0379-6566
- Print ISBN:
- 978-1-4244-1704-9
- INSPEC Accession Number:
- 10861567
- Conference Location :
- Deauville
- Digital Object Identifier :
- 10.1109/RADECS.2007.5205555
- Product Type:
- Conference Publications
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