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Post-silicon tuning capabilities of 45nm low-power CMOS digital circuits

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4 Author(s)
Meijer, M. ; NXP Semiconductors, Eindhoven, The Netherlands ; Bo Liu ; van Veen, Rutger ; de Gyvez, J.P.

Adaptive circuit techniques enable modification of power-performance efficient circuit operation. Yet it is unclear if such techniques remain effective in modern deep-submicron CMOS. In this paper we examine the technological boundaries of supply voltage scaling and body biasing in 45nm low-power CMOS. We demonstrate that there exists an effective tuning range for power-performance and performance variability control. Our analysis is supported by ring oscillator test-chip measurements.

Published in:

VLSI Circuits, 2009 Symposium on

Date of Conference:

16-18 June 2009