By Topic

Microwave reflections for carrier lifetime measurements: a comprehensive study on sensitivity and transient response

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
M. Schofthaler ; Max-Planck-Inst. fur Festkorperforschung, Stuttgart, Germany ; R. Brendel

The time-resolved microwave reflection technique is widely used for process control in the photovoltaic community. We demonstrate how to optimize the sensitivity and the reliability of carrier lifetime measurements with this method. Our approach is based on a dielectric multilayer model that allows us to calculate microwave reflection transients from excess carrier decay after pulsed laser excitation. We find that the reflected microwave power mirrors the carrier decay only if the reflector is positioned appropriately

Published in:

Photovoltaic Energy Conversion, 1994., Conference Record of the Twenty Fourth. IEEE Photovoltaic Specialists Conference - 1994, 1994 IEEE First World Conference on  (Volume:2 )

Date of Conference:

5-9 Dec 1994