Cart (Loading....) | Create Account
Close category search window
 

Accelerated Irradiation Method to Study Synergy Effects in Bipolar Integrated Circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

14 Author(s)
Roche, N.J.-H. ; IES, Univ. Montpellier II, Montpellier, France ; Gonzalez Velo, Y. ; Dusseau, L. ; Boch, J.
more authors

An accelerated irradiation technique is used to study dose-ASET synergy effects. The impact of TID on SET is found to be identical when the dose rate is switched from high to low or from low to high.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:56 ,  Issue: 4 )

Date of Publication:

Aug. 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.