Referenced Items are not available for this document.
Proton-induced single-event effects hardness assurance guidelines are developed to address issues raised by recent test results in advanced IC technologies for use in space environments. Specifically, guidelines are developed that address the effects of proton energy and angle of incidence on single-event latchup and the effects of total dose on single-event upset. The guidelines address both single-event upset (SEU), single-event latchup (SEL), and combined SEU and total ionizing dose (TID) effects.
Published in:
Nuclear Science, IEEE Transactions on
(Volume:56
,
Issue:
4
)
Date of Publication: Aug. 2009
- Page(s):
- 2171 - 2178
- ISSN :
- 0018-9499
- INSPEC Accession Number:
- 10829043
- Digital Object Identifier :
- 10.1109/TNS.2009.2013239
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 18 August 2009
- Issue Date :
- Aug. 2009
- Sponsored by :
- IEEE Nuclear and Plasma Sciences Society
About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.
